NIC® Network Information Computer® DISCONTINUED

Multi-Port Transport Test Platform

The Digital Lightwave®* (DLI) NIC® is a scalable test solution for verifying and qualifying the performance of today’s multi-protocol global communications networks, covering Ethernet, Fibre Channel, OTN, SONET/SDH, and PDH/DSn testing. With a flexible software/firmware-based architecture, the scalable NIC® combines in a single platform the multitude of traditional hardware-based test sets required to install, maintain, and monitor high-speed multi-protocol net-works. The NIC® is designed to grow as your network grows, and as technologies change.

The following NIC Platforms are available:

  • NIC NXG (2-slot)
  • NIC BP (2-slot, battery pack)
  • NIC Plus® NXG (5-slot)
  • NIC EP (5-slot, rackmount)

The following test module options are available:

  • PDH/T-Carrier Module with Optional Jitter and Wander Testing
  • MSA 2020/2030 Module
  • Optical Jitter and Wander Modules
  • CSA 4100 40G/100G Module
  • OSA Module with C-Band and L-Band
  • Serial Interface Module
  • ATM Module

  • Test ports can be configured independently and operated simultaneously
  • Multi-rate (up to 112G), multi-user (up to 20 concurrent users), multi-protocol operation
  • All-in-one solution with comprehensive feature set
  • Highest port density in a portable form factor
  • Every test feature accessible locally, by remote GUI or SCPI automation scripts
  • Most intuitive interface in the industry with simplest, most consistent setup and workflow across all protocols
  • Industry proven technology in a platform that provides continuity, maintains familiarity, long term support, and service

OTN

  • All G.709 OTN rates 2.6G up to 112G with FEC generation and analysis
  • OTU4, OTU3, OTU3e1/OTU3e2, OTU2f/OTU1f, OTU2e/OTU1e, OTU2, and OTU1
  • OTL layer testing at 40/100G rates; unframed BERT testing for all rates
  • ODU multiplexing with simultaneous generation and analysis at all levels; ODU0 and ODUflex (support is line rate dependent)
  • GFP-T/GFP-F/Ethernet, Fibre Channel, SONET/SDH, PRBS and Null Client mappings (support is line rate dependent)
  • Multi-Channel generation and analysis for OTU1 and OTU2
  • Complete OTN overhead manipulation and analysis with byte capture, including trace and MSI bytes
  • Intrusive and non-intrusive Pass Thru mode with byte and error/alarm overwrite
  • Error/alarm generation with periodic burst insert and analysis
  • OPU/client justification offset generation and analysis at all layers
  • Service Disruption and Round Trip Delay measurements at any ODTU level
  • OTU1 (NIC+)
  • 155M-2.5G SONET/SDH (NIC+)
  • PDH/T-Carrier (NIC and NIC+)

PDH/T-Carrier

  • 1.5M/2M/34M/45M/139M - DS1/E1/E3/DS3/E4
  • Bulk and multiplexed mapping structures; Fractional E1 and 56K/64K Fractional DS1 testing
  • Drop and insert from SONET/SDH
  • External Add/Drop line interface modes
  • Performance monitoring per G.821, G.826, and M.2100
  • Signal level and line frequency generation and analysis
  • Service Disruption and Round Trip Delay measurements
  • Simultaneous and independent interface testing; dual DS1/E

Fibre Channel

  • All Fibre Channel rates 1G up to 11.3G
  • OTU1f/OTU2f and 1/2/4/8/10G
  • Unframed BERT testing for OTU1f/OTU2f, 8G, 10G
  • Switch Fabric and Name Server login
  • Test stream with user defined addressing, frame parameters, frame size, pattern and rate
  • Error and alarm generation and analysis
  • Primitive sequence generation
  • RFC 2544 like Throughput/Latency/Frame Loss/Performance test
  • Buffer-to-buffer credit / flow control analysis
  • Per-port and per-stream results include: port utilization, counts, and per-stream latency statistics
  • Service Disruption measurement for OTU1f/OTU2f, 10G

Jitter/Wander Generation and Analysis

  • OTU1 (NIC+)
  • 155M-2.5G SONET/SDH (NIC+)
  • PDH/T-Carrier (NIC and NIC+)

Serial Interface Testing

  • RS-530/RS-232 testing with synchronous and asynchronous operation
  • DCE and DTE emulation
  • 25-pin D-type connector

Ethernet/IP Testing

  • All Ethernet rates 10M up to 100G
  • 100G, 40G, OTU2e/OTU1e, 10G LAN, 10G WAN, 1G, 100M, and 10/100/1000BASE-T
  • PCS layer testing at 40/100G rates; unframed BERT testing
  • 32 IPv4/IPv6 test streams with independent addressing, traffic parameters, frame size (up to 16k), pattern, and rate mode (40/100G IPv4 only)
  • Y.1564; RFC 2544 Throughput/Latency/Frame Loss/Back to Back Burst Performance test
  • VLAN and MPLS tags up to 4 levels with QoS statistics (40/100G VLAN only)
  • Per-port and per-stream results include: port utilization, counts, packet size distribution, and per stream latency and jitter statistics
  • Service Disruption Measurement

SONET/SDH Testing

  • All SONET/SDH rates 52M up to 40G
  • STM-256/STM-64/STM-16/STM-4/STM-1/STM-0/STM-1e/STM-0e; OC-768/OC-192/OC-48/OC-12/OC-3/OC-1/EC-3/EC-1
  • Serial and multi-lane 40G interfaces; STL-256.4 multi-lane logical layer testing
  • SONET mappings: STS-768c, STS-192c, STS-48c, STS-12c, STS-3c, STS-1, VT-6, VT-2 and VT-1.5 (support is line rate dependent)
  • SDH mappings: AU-4-256c, AU-4-64c, AU-4-16c, AU-4-4c, AU-4/C-4 and AU-4/AU-3 C-3/C-2/C-12/C-11; VCAT/LCAS (support is line rate dependent)
  • PRBS, PDH/T-Carrier, and GFP-T/GFP-F/Ethernet clients; unframed BERT testing for all rates (support is line rate dependent)
  • All Path Testing™ (APT) 10G and below – simultaneous testing of all HP/STS containers/SPEs
  • Complete SONET/SDH Overhead and trace manipulation/analysis with byte capture
  • Intrusive and non-intrusive Pass Thru mode with byte and error/alarm overwrite
  • Line frequency offset generation and analysis
  • Service Disruption, Round Trip Delay measurements, and APS Testing
  • Performance monitoring statistics

CFP Testing

  • CFP Health Check
  • CFP MDIO Display

Optical Spectrum Analyzer

  • Wavelength Range: C-band 1528.77 to 1562.23 nm, L-band 1568.77 to 1604.03 nm
  • 50 GHz Absolute Channel Spacing; 85 C-band/L-band channels
  • Maximum Input Power (all channels): 23 dBm, Single Channel: C-Band: -10 to -40 dBm/L-band:-10 to -35dBm
  • Absolute Channel Power Accuracy (include PDL): ±0.7db
  • Power Measurement Repeatability (for fixed polarization): ±0.1 dB
  • Polarization Dependent Loss: <0.3 dB
  • Absolute Wavelength Accuracy: ±60 pm
  • OSNR Measurement Range: 10-25 dB (dependent on channel input power, noise floor, and filter isolation)
  • OSNR Accuracy: ±1.5 dB (noise level ≥ -50 dBm, L-band noise level ≥ -45 dBm)
  • Noise Floor: -60 dBm
  • Power Measurement Resolution: 0.1 dB
Specification Sheet
User Manuals
Technical Notes
Software

Attention: DO NOT downgrade the software version currently installed in your test platform or module, unless specifically instructed by a VeEX Customer Care/Support agent. Your new test set may have been shipped with a newer version. For software upgrades, please check the current version(s) on your test set to confirm that the software posted here is a newer version and carefully read the Release Notes for the recommended platform versions.

Release Notes
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* Digital Lightwave® (DLI) was acquired by VeEX in 2016 and it now operates as a wholly-owned division of VeEX Inc.